Image taken from ScienceDirect.com
Researchers from the Shenzhen Institute of Advanced Technology (SIAT) of the Chinese Academy of Sciences and Central China Normal University have developed a high-performance perovskite X-ray detector, designed to enhance medical imaging. Published in Nature Communications, the study introduces a direct-conversion X-ray detector that integrates a thick perovskite film with a CMOS pixel array, offering improved spatial resolution and lower radiation doses.
Traditional semiconductor materials used in X-ray imaging, like silicon and cadmium zinc telluride, often suffer from low X-ray absorption efficiency or high costs. The newly developed perovskite detector addresses these issues by using a CsPbBr3 perovskite film, which demonstrates high detection sensitivity and a significantly lower dose detection limit.
The detector achieves excellent spatial resolution and has been successfully tested in 2D and 3D CT imaging, even at high speeds of 300 frames per second. This advancement indicates a promising future for medical imaging technologies, making X-ray procedures safer and more effective.
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